Author:
Yoon Changwook,Tsiklauri Mikheil,Zvonkin Mikhail,Fan Jun,Drewniak James L.,Razmadze Alexander,Aflaki Aman,Kim Jingook,Chen Qinghua Bill
Cited by
10 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. S-parameter Extrapolation for Improving Near-f
max Accuracy in 2x-thru Calibration;IEEE Transactions on Electromagnetic Compatibility;2024-08
2. Fixture De-Embedding Challenges for Short 2xThru Structure;2023 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS);2023-12-12
3. Fixture Mismatch Correction for Wideband Measurements;2023 IEEE USNC-URSI Radio Science Meeting (Joint with AP-S Symposium);2023-07-23
4. Influence of Solder on De-Embedded Capacitance;2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC);2022-09-01
5. A Simple Solder-Free Fixture for Surface Mounted Device Measurement;2022 International Conference on Microwave and Millimeter Wave Technology (ICMMT);2022-08-12