A Simple Solder-Free Fixture for Surface Mounted Device Measurement
Author:
Affiliation:
1. Zhejiang University College of Information Science and Electronic Engineering,Hangzhou,China
Funder
National Science Foundation of China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10022051/10022057/10022568.pdf?arnumber=10022568
Reference6 articles.
1. Comparison of TRL calibration vs. 2x thru de-embedding methods
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4. A Thru-Halfthru-Short De-Embedding Method for Millimeter-Wave On-Wafer HBT Characterization
5. Application of 2X Method for Components Parameters Extraction
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