Fixture De-Embedding Challenges for Short 2xThru Structure-Reference-Cited by-同舟云学术

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Fixture De-Embedding Challenges for Short 2xThru Structure

Published:2023-12-12 Issue: Volume: Page:1-3
ISSN:
Container-title:2023 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)
language:
Short-container-title:

Author:

Oniani S.¹,Tsiklauri G.²,Tsintsadze G.³,Dikhaminjia N.¹,Zai R.⁴,Drewniak J.³,Tsiklauri M.³

Affiliation:

1. Alte University,School of Information Technology University,Tbilisi,Georgia,0177

2. University of California Davis,One Shields Avenue,School of Computer Science and Engineering,Davis,CA,95616

3. Missouri University of Science and Technology,Electromagnetic Compatibility Laboratory,Department of Electrical and Computer Engineering,Rolla,MO,65409

4. PacketMicro Inc,Santa Clara,USA

Funder

National Science Foundation

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10467193/10468066/10468100.pdf?arnumber=10468100

Reference16 articles.

1. A NIST traceable PCB kit for evaluating the accuracy of de-embedding algorithms and corresponding metrics;Barnes

2. Design criteria of automatic fixture removal (AFR) for asymmetric fixture de-embedding

3. Analytical and numerical sensitivity analyses of fixtures de-embedding

4. Error bounds analysis of de-embedded results in 2x thru de-embedding methods

5. Verifying the accuracy of 2x-Thru de-embedding for unsymmetrical test fixtures

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