RAMSES-FT: a fault simulator for flash memory testing and diagnostics
Author:
Publisher
IEEE Comput. Soc
Link
http://xplorestaging.ieee.org/ielx5/7901/21789/01011153.pdf?arnumber=1011153
Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Fault-coverage Maximizing March Tests for Memory Testing;2022 IEEE International Test Conference (ITC);2022-09
2. Fine-Grained Built-In Self-Repair Techniques for NAND Flash Memories;2022 IEEE International Test Conference (ITC);2022-09
3. Fault Modeling and Testing of Memristor-Based Spiking Neural Networks;2022 IEEE International Test Conference (ITC);2022-09
4. Development of a Hardware and Software Complex Based on the Study of the Diagnostic Properties of Methods for Testing Nonvolatile Memory with a Serial Interface;2022 Moscow Workshop on Electronic and Networking Technologies (MWENT);2022-06-09
5. Testing Disturbance Faults in Various NAND Flash Memories;Journal of Electronic Testing;2014-11-01
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