Author:
Chaudhuri Arjun,Liu Chunsheng,Fan Xiaoxin,Chakrabarty Krishnendu
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
12 articles.
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1. Dynamic Test Compaction of a Compressed Test Set Shared Among Logic Blocks;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-01
2. DiagNNose: Toward Error Localization in Deep Learning Hardware-Based on VTA-TVM Stack;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-01
3. STRAIT: Self-Test and Self-Recovery for AI Accelerator;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-09
4. Testability and Dependability of AI Hardware: Survey, Trends, Challenges, and Perspectives;IEEE Design & Test;2023-04
5. Sharing of Compressed Tests Among Logic Blocks;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-04