Identifying Reliability-Critical Primary Inputs of Combinational Circuits Based on the Model of Gate-Sensitive Attributes-Reference-Cited by-同舟云学术

Identifying Reliability-Critical Primary Inputs of Combinational Circuits Based on the Model of Gate-Sensitive Attributes

Published:2022-11 Issue:11 Volume:41 Page:4708-4720
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Xiao Jie¹^ORCID,Chen Wenbo¹,Lou Jungang²^ORCID,Jiang Jianhui³^ORCID,Zhou Qianwei¹^ORCID

Affiliation:

1. College of Computer Science and Technology, Zhejiang University of Technology, Hangzhou, China

2. Zhejiang Province Key Laboratory of Smart Management and Application of Modern Agricultural Resources and the College of Information Engineering, Huzhou University, Huzhou, China

3. School of Software Engineering, Tongji University, Shanghai, China

Funder

National Natural Science Foundation of China

Natural Science Foundation of Zhejiang Province

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/43/9928799/09677024.pdf?arnumber=9677024

Reference22 articles.

1. A Stochastic Computational Approach for Accurate and Efficient Reliability Evaluation