Author:
Han Jie,Chen Hao,Boykin Erin,Fortes José
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference30 articles.
1. Designing reliable systems from unreliable components: the challenges of transistor variability and degradation;Borkar;IEEE Micro,2005
2. Nano-CMOS circuit and physical design;Wong,2005
3. Trends and challenges in VLSI circuit reliability;Constantinescu;IEEE Micro,2003
4. International Technology Roadmap for Semiconductors; 2009. .
5. Shanbhag NR, Mitra S, de Veciana G, Orshansky M, Marculescu R, Roychowdhury J, Jones D, Rabaey JM. The search for alternative computational paradigms. The special issue on “System IC Design Challenges beyond 32nm”. IEEE Des Test Comput 2008;25(4).
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