Monolithically Integrated Microheater for On-Chip Annealing of Oxide Defects
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/55/7956370/07917291.pdf?arnumber=7917291
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1. An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage;Micromachines;2024-06-08
2. Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor (Invited Paper);2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14
3. Evidence of Transport Degradation in 22 nm FD-SOI Charge Trapping Transistors for Neural Network Applications;Solid-State Electronics;2023-11
4. 3D Neuromorphic Hardware with Single Thin‐Film Transistor Synapses Over Single Thin‐Body Transistor Neurons by Monolithic Vertical Integration;Advanced Science;2023-09-15
5. Towards Complete Recovery of Circuit Degradation by Annealing With On-Chip Heaters;IEEE Electron Device Letters;2023-02
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