Does Aging Matter? The Curious Case of Fault Sensitivity Analysis-Reference-Cited by-同舟云学术

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Does Aging Matter? The Curious Case of Fault Sensitivity Analysis

Published:2022-04-06 Issue: Volume: Page:
ISSN:
Container-title:2022 23rd International Symposium on Quality Electronic Design (ISQED)
language:
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Author:

Ebrahimabadi Mohammad¹,Fadaeinia Bijan²,Moradi Amir²,Karimi Naghmeh¹

Affiliation:

1. University of Maryland Baltimore County,United States

2. Ruhr University,Bochum,Germany

Funder

National Science Foundation

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9806045/9806137/09806232.pdf?arnumber=9806232

Reference25 articles.

1. Masked SABL: A Long Lasting Side-Channel Protection Design Methodology

2. A Silicon-Level Countermeasure Against Fault Sensitivity Analysis and Its Evaluation

3. On the Power of Fault Sensitivity Analysis and Collision Side-Channel Attacks in a Combined Setting

4. Impact of Aging on the Reliability of Delay PUFs

5. ExtraTime: Modeling and analysis of wearout due to transistor aging at microarchitecture-level

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Enhancing Hardware Security: An Analysis of SRAM-PUFs;NAECON 2023 - IEEE National Aerospace and Electronics Conference;2023-08-28

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