Author:
Endo Sho,Li Yang,Homma Naofumi,Sakiyama Kazuo,Ohta Kazuo,Fujimoto Daisuke,Nagata Makoto,Katashita Toshihiro,Danger Jean-Luc,Aoki Takafumi
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
12 articles.
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2. LDTFI: Layout-aware Timing Fault-Injection Attack Assessment Against Differential Fault Analysis;2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI);2022-07
3. Does Aging Matter? The Curious Case of Fault Sensitivity Analysis;2022 23rd International Symposium on Quality Electronic Design (ISQED);2022-04-06
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