ExtraTime: Modeling and analysis of wearout due to transistor aging at microarchitecture-level-Reference-Cited by-同舟云学术

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ExtraTime: Modeling and analysis of wearout due to transistor aging at microarchitecture-level

Published:2012-06 Issue: Volume: Page:
ISSN:
Container-title:IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012)
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Author:

Oboril Fabian,Tahoori Mehdi B.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/6253623/6263904/06263957.pdf?arnumber=6263957

Cited by 25 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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