Challenges in Generating True Random Numbers Considering the Variety of Corners, Aging, and Intentional Attacks
Author:
Affiliation:
1. University of Maryland Baltimore County,United States
2. Institut Polytechnique de Paris,LTCI, Télécom Paris,France
3. Secure-IC S.A.S.,France
Funder
National Science Foundation
BP
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10332255/10332256/10332319.pdf?arnumber=10332319
Reference19 articles.
1. Special Session: Security Verification & Testing for SR-Latch TRNGs
2. Leakage Power Analysis in Different S-Box Masking Protection Schemes
3. Contactless Electromagnetic Active Attack on Ring Oscillator Based True Random Number Generator
4. DRAM Retention Behavior with Accelerated Aging in Commercial Chips
5. Common Criteria Consortium;Common Criteria (aka CC) for Information Technology Security Evaluation (ISO/IEC 15408),2013
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