Defect-Related Degradation of AlGaN-Based UV-B LEDs
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/16/7792766/07774995.pdf?arnumber=7774995
Cited by 63 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. MeV proton and neutron damage effects on deep-ultraviolet light-emitting diodes;Journal of Vacuum Science & Technology B;2024-08-21
2. Study on the Degradation Performance of AlGaN-Based Deep Ultraviolet LEDs under Thermal and Electrical Stress;Coatings;2024-07-19
3. Effect of Trap Behavior on Recombination in AlGaN-Based UV-C LEDs Degradation;IEEE Transactions on Electron Devices;2024-03
4. Study on Degradation of Deep‐Ultraviolet Laser Diode;physica status solidi (a);2024-02-26
5. Defect Behavior on the Degradation of AlGaN-Based 234 nm LEDs;IEEE Transactions on Electron Devices;2024-02
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