Importance of Charge Trapping/Detrapping Involving the Gate Electrode on the Noise Currents of Scaled MOSFETs
Author:
Affiliation:
1. Dipartimento di Ingegneria “Enzo Ferrari” (DIEF), Università degli Studi di Modena e Reggio Emilia, Modena, Italy
2. Dipartimento Politecnico di Ingegneria e Architettura (DPIA), Università degli Studi di Udine, Udine, Italy
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/16/9722602/09712620.pdf?arnumber=9712620
Reference33 articles.
1. Origin of the front-back-gate coupling in partially depleted and fully depleted silicon-on-insulator metal-oxide-semiconductor field-effect transistors with accumulated back gate
2. FinFET and MOSFET preliminary comparison of gate oxide reliability
3. Modeling the charge transport mechanism in amorphous Al2O3 with multiphonon trap ionization effect
4. Oxygen vacancy in Al2O3: Photoluminescence study and first-principle simulation
5. Low-frequency noise in nanowire and planar III-V MOSFETs
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Characterization and Advanced Modeling of Dielectric Defects in Low-Thermal Budget RMG MOSFETs Using 1/f Noise Analysis;IEEE Transactions on Electron Devices;2024-03
2. Probing Band Tail States in MOSFETs at Cryogenic Temperatures through Noise Spectroscopy;2023 International Conference on Noise and Fluctuations (ICNF);2023-10-17
3. Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures;IEEE Transactions on Electron Devices;2023-04
4. On the accuracy of the formula used to extract trap density in MOSFETs from 1/f noise;Solid-State Electronics;2022-08
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3