Cryogenic Characterization and Analysis of Nanoscale SOI FETs Using a Virtual Source Model
Author:
Affiliation:
1. School of Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, AZ, USA
2. Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA
Funder
ARMY Small Business Technology Transfer
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
https://ieeexplore.ieee.org/ielam/16/9722602/9691473-aam.pdf
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