A Survey on Automatic Printed Circuit Board Defect Detection Techniques
Author:
Affiliation:
1. ECE, Chandigarh University,Punjab,India,140413
2. AIT-CSE, Chandigarh University,Punjab,India,140413
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9823381/9823413/09823872.pdf?arnumber=9823872
Reference31 articles.
1. Applying deep learning to defect detection in printed circuit boards via a newest model of you-only-look-once
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