Wavelet-based printed circuit board inspection algorithm-Reference-Cited by-同舟云学术

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Wavelet-based printed circuit board inspection algorithm

Published:2005-04-05 Issue:2 Volume:12 Page:201-213
ISSN:1875-8835
Container-title:Integrated Computer-Aided Engineering
language:
Short-container-title:ICA

Author:

Ibrahim Zuwairie¹,Rahman Al-Attas Syed Abdul²

Affiliation:

1. Institute of Applied DNA Computing, Meiji University, 1-1-1 Higashi-mita, Tama-ku, Kawasaki, Kanagawa-ken, 214-8571, Japan. Tel.: Fax: ; E-mail: zuwairie@isc.meiji.ac.jp

2. Department of Microelectronics and Computer Engineering, Faculty of Electrical Engineering, Universiti Teknologi Malaysia, 81310 Skudai, Johor Darul Takzim, Malaysia

Publisher

IOS Press

Subject

Artificial Intelligence,Computational Theory and Mathematics,Computer Science Applications,Theoretical Computer Science,Software

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An Improved YOLOv5 Network for Detection of Printed Circuit Board Defects;Journal of Sensors;2023-03-02

2. End-to-end deep learning framework for printed circuit board manufacturing defect classification;Scientific Reports;2022-07-22

3. A Survey on Automatic Printed Circuit Board Defect Detection Techniques;2022 2nd International Conference on Advance Computing and Innovative Technologies in Engineering (ICACITE);2022-04-28

4. Integral images-based approach for fabric defect detection;Optics & Laser Technology;2022-03

5. Spectral Reflectance Images and Applications;Image Feature Detectors and Descriptors;2016

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