An Improved YOLOv5 Network for Detection of Printed Circuit Board Defects

Author:

Niu Jie1ORCID,Li Hongyan2,Chen Xu1,Qian Kun3

Affiliation:

1. School of Electronic Engineering, Changzhou College of Information Technology, Changzhou 213164, China

2. School of Artificial Intelligence and Information Technology, Nanjing University of Chinese Medicine, Nanjing 210023, China

3. School of Automation, Southeast University, Nanjing, 210096 Jiangsu, China

Abstract

With the rapid development of China’s printed circuit board industry, bare-board defect detection has high research and application values as an important factor in improving production quality. In this paper, a new detection method based on YOLOv5 is proposed to solve the balance problem of efficiency and performance in the task of circuit board defect detection. First, the k -means++ method is used to improve the location matching of the prior anchor boxes. Second, the Focal-EIOU loss function is used instead of GIOU to address the former’s degeneration issue. Finally, the ECA-Net module is added to enhance the sensitivity of the model to channel features. Experiments were conducted on a public defect dataset, and superior performance was achieved. The proposed method achieves 99.1% mean average precision at 86 frames per second. Compared with other advanced methods, the proposed method achieves the highest mean average precision value, and the detection speed allows real-time applications.

Funder

Qinglan Project of Jiangsu Province of China

Publisher

Hindawi Limited

Subject

Electrical and Electronic Engineering,Instrumentation,Control and Systems Engineering

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