A Deep Learning-based Microsection Measurement Framework for Print Circuit Boards
Author:
Affiliation:
1. National Central University,Department of Computer Science and Information Engineering,Taoyuan,Taiwan
2. Yuan Ze University,Department of Computer Science and Engineering,Taoyuan,Taiwan
Funder
National Science and Technology Council
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10205370/10205373/10205911.pdf?arnumber=10205911
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