Convolutional Neural Network for Semiconductor Wafer Defect Detection-Reference-Cited by-同舟云学术

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Convolutional Neural Network for Semiconductor Wafer Defect Detection

Published:2019-07 Issue: Volume: Page:
ISSN:
Container-title:2019 10th International Conference on Computing, Communication and Networking Technologies (ICCCNT)
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Author:

Devika B,George Neetha

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8932651/8944341/08944584.pdf?arnumber=8944584

Cited by 24 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Recognition and Classification of Mixed Defect Pattern Wafer Map Based on Multi-Path DCNN;IEEE Transactions on Semiconductor Manufacturing;2024-08

2. Intelligent Electrical Assessment of Silicon and Silicon Carbide Wafers for Power Applications in Automotive Field;2024 IEEE International Workshop on Metrology for Automotive (MetroAutomotive);2024-06-26

3. An efficient deep learning framework for mixed-type wafer map defect pattern recognition;AIP Advances;2024-04-01

4. An unknown wafer surface defect detection approach based on Incremental Learning for reliability analysis;Reliability Engineering & System Safety;2024-04

5. Wafer Defect Identification with Optimal Hyper-Parameter Tuning of Support Vector Machine Using the Deep Feature of ResNet 101;Defect and Diffusion Forum;2024-01-09

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