Built-In Self-Test Techniques-Reference-Cited by-同舟云学术

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Built-In Self-Test Techniques

Published:1985 Issue:2 Volume:2 Page:21-28
ISSN:0740-7475
Container-title:IEEE Design & Test of Computers
language:
Short-container-title:IEEE Des. Test. Comput.

Author:

McCluskey Edward

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx5/54/4069524/04069538.pdf?arnumber=4069538

Cited by 160 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Improving the Efficiency of Software-Based Fault Protection Mechanisms With HUSTLE;IEEE Access;2024

2. An Evaluation of Estimated Field Random Testability for Data Paths at Register Transfer Level Using Status Signal Sequences Based on k-Consecutive State Transitions for Field Testing;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03

3. A Novel Test Pattern Optimization Method Using Recurrent Neural Network;Journal of Circuits, Systems and Computers;2023-09-22

4. New Approaches of Side-Channel Attacks Based on Chip Testing Methods;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-05

5. Implementation of N-bit Universal BIST for Testing of Memory and Arithmetic Operator Using FPGA;2022 International Conference on Recent Trends in Microelectronics, Automation, Computing and Communications Systems (ICMACC);2022-12-28

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