Warpage Modeling and Characterization of the Viscoelastic Relaxation for Cured Molding Process in Fan-Out Packages

Author:

Yeh Shu-Shen,Lin Po-Yao,Lee Kuang-Chun,Wang Jin-Hua,Lin Wen-Yi,Yew Ming-Chih,Lai Po-Chen,Leu Shyue-Ter,Jeng Shin-Puu

Publisher

IEEE

Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Simulation and Metrological Applications for RDL Patterning Development of Glass Substrate;2024 IEEE 74th Electronic Components and Technology Conference (ECTC);2024-05-28

2. Warpage Estimation of Panel-Level Packaging by AI-assisted Design on Simulation;2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2024-04-07

3. Warpage characterization of a large size fan-out panel subjected to inhomogeneous heating by a digital fringe projection system;Microelectronics Reliability;2022-12

4. Simulation methodology development of warpage estimation for epoxy molding compound under considerations of stress relaxation characteristics and curing conditions applied in semiconductor packaging;Materials Science in Semiconductor Processing;2022-07

5. Next-Generation High-Density PCB Development by Fan-Out RDL Technology;IEEE Transactions on Device and Materials Reliability;2022-06

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