Author:
Mintarno E.,Chandra V.,Pietromonaco D.,Aitken R.,Dutton R. W.
Cited by
18 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. An Efficient Aged Timing Analysis Method for Digital Integrated Circuit Under NBTI Effect;2024 2nd International Symposium of Electronics Design Automation (ISEDA);2024-05-10
2. Logical Resolving-Based Methodology for Efficient Reliability Analysis;Micromachines;2023-12-30
3. ML to the Rescue;Proceedings of the 28th Asia and South Pacific Design Automation Conference;2023-01-16
4. Measurement Results of Real Circuit Delay Degradation under Realistic Workload;IPSJ Transactions on System and LSI Design Methodology;2023
5. Efficient Analysis for Mitigation of Workload-Dependent Aging Degradation;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-12