Author:
Mintarno E.,Chandra V.,Pietromonaco D.,Aitken R.,Dutton R. W.
Cited by
17 articles.
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1. Logical Resolving-Based Methodology for Efficient Reliability Analysis;Micromachines;2023-12-30
2. ML to the Rescue;Proceedings of the 28th Asia and South Pacific Design Automation Conference;2023-01-16
3. Measurement Results of Real Circuit Delay Degradation under Realistic Workload;IPSJ Transactions on System and LSI Design Methodology;2023
4. Efficient Analysis for Mitigation of Workload-Dependent Aging Degradation;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-12
5. Impacts of Process Variations and Aging on Lifetime Reliability of Flip-Flops;Lifetime Reliability-aware Design of Integrated Circuits;2022-11-17