An Efficient Aged Timing Analysis Method for Digital Integrated Circuit Under NBTI Effect-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

An Efficient Aged Timing Analysis Method for Digital Integrated Circuit Under NBTI Effect

Published:2024-05-10 Issue: Volume: Page:474-479
ISSN:
Container-title:2024 2nd International Symposium of Electronics Design Automation (ISEDA)
language:
Short-container-title:

Author:

Zhang Yang¹,Tang Zhengguang¹,Jin Yawei¹,Zhang Hong¹,Sun Yongsheng²,Chen Chen²,Lin Xiaoling³,Li Cong¹,You Hailong¹

Affiliation:

1. School of Microelectronic Xidian University,Xi'an,China

2. HiSilicon Technologies Co., Ltd,Shenzhen,China

3. China Electronic Product Reliability and Environmental Testing Research Institute,The Science and Technology on Reliability Physics and Application of Electronic Component Laboratory,Guangzhou,Guangdong Province,China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10616249/10617469/10617875.pdf?arnumber=10617875

Reference8 articles.

1. A design-for-reliability approach based on grading library cells for aging effects

2. The impact of bias temperature instability for direct-tunneling ultra-thin gate oxide on MOSFET scaling

3. Workload dependent NBTI and PBTI analysis for a sub-45nm commercial microprocessor

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP