A step ahead toward a new microscopic picture for charge trapping/detrapping in flash memories-Reference-Cited by-同舟云学术

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A step ahead toward a new microscopic picture for charge trapping/detrapping in flash memories

Published:2016-04 Issue: Volume: Page:
ISSN:
Container-title:2016 IEEE International Reliability Physics Symposium (IRPS)
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Author:

Resnati Davide,Compagnoni Christian Monzio,Paolucci Giovanni M.,Miccoli Carmine,Barber John,Bertuccio Massimo,Beltrami Silvia,Lacaita Andrea L.,Spinelli Alessandro S.,Visconti Angelo

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7565237/7574493/07574569.pdf?arnumber=7574569

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Distributed Cycling in Charge Trap-Based 3D NAND Arrays: Model and Qualification Tests Implications;2023 IEEE International Memory Workshop (IMW);2023-05

2. Analysis of High-Temperature Data Retention in 3D Floating-Gate nand Flash Memory Arrays;IEEE Journal of the Electron Devices Society;2023

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