A highly reliable and tamper-resistant RRAM PUF: Design and experimental validation-Reference-Cited by-同舟云学术

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A highly reliable and tamper-resistant RRAM PUF: Design and experimental validation

Published:2016-05 Issue: Volume: Page:
ISSN:
Container-title:2016 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)
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Author:

Liu Rui,Wu Huaqiang,Pang Yachun,Qian He,Yu Shimeng

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7489989/7495545/07495549.pdf?arnumber=7495549

Cited by 49 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Volatile threshold switching devices for hardware security primitives: Exploiting intrinsic variability as an entropy source;Applied Physics Reviews;2024-05-23

2. Harnessing Entropy: RRAM Crossbar-based Unified PUF and RNG;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06

3. Characterization of ReRAM Arrays Operating in the Pre-formed Range to Design Reliable PUFs;Lecture Notes in Networks and Systems;2024

4. Memristor-Based Signal Processing for Compressed Sensing;Nanomaterials;2023-04-13

5. A Security-Enhanced, Charge-Pump-Free, ISO14443-A-/ISO10373-6-Compliant RFID Tag With 16.2-μW Embedded RRAM and Reconfigurable Strong PUF;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-02

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