A Security-Enhanced, Charge-Pump-Free, ISO14443-A-/ISO10373-6-Compliant RFID Tag With 16.2-μW Embedded RRAM and Reconfigurable Strong PUF-Reference-Cited by-同舟云学术

A Security-Enhanced, Charge-Pump-Free, ISO14443-A-/ISO10373-6-Compliant RFID Tag With 16.2-μW Embedded RRAM and Reconfigurable Strong PUF

Published:2023-02 Issue:2 Volume:31 Page:243-252
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Ren Qirui¹^ORCID,Huo Qiang¹^ORCID,Chen Zhisheng¹,Gao Qi¹,Wang Yiming²^ORCID,Yang Yiming²,Wu Hao¹,Fu Xiangqu¹^ORCID,Xu Xiaoxin¹^ORCID,Luo Qing¹^ORCID,Gao Jianfeng¹,Chen Chengying³,Zhao Xiaojin⁴^ORCID,Lei Dengyun⁵^ORCID,Wang Xinghua²^ORCID,Zhang Feng¹^ORCID,Chen Yong⁶^ORCID,Mak Pui-In⁶^ORCID

Affiliation:

1. Key Laboratory of Microelectronics Device and Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China

2. School of Information and Electronics, Beijing Institute of Technology, Beijing, China

3. School of Microelectronics, Xiamen University of Technology, Xiamen, China

4. College of Electronics and Information Engineering, Shenzhen University, Shenzhen, China

5. School of Integrated Circuits, Guangdong University of Technology, Guangzhou, China

6. State Key Laboratory of Analog and Mixed-Signal VLSI and the Faculty of Science and Technology–Department of ECE, University of Macau, Macao, China

Funder

National Key Research Plan of China

Strategic Priority Research Program of the Chinese Academy of Sciences China

National Natural Science Foundation of China

Science and Technology Development Fund, Macau

Science and Technology Development Fund

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx7/92/10019332/09964129.pdf?arnumber=9964129

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3. Physical Unclonable Functions and Applications: A Tutorial

4. 25.2 A reconfigurable RRAM physically unclonable function utilizing post-process randomness source with <6×10?6 native bit error rate;pang;IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers,2019

5. 19.4 Embedded 1 Mb ReRAM in 28 nm CMOS with 0.27-to-1 V read using swing-sample-and-couple sense amplifier and self-boost-write-termination scheme;chang;IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers,2014