Optimizing RRAM Performance: A Comparative Analysis of Forming Strategies
Author:
Affiliation:
1. Univ. Grenoble Alpes,CEA, Leti,Grenoble,France,F-38000
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10536936/10536916/10536941.pdf?arnumber=10536941
Reference11 articles.
1. Reliability of 28nm embedded RRAM for consumer and industrial products
2. ReRAM Technologies for Embedded Memory and Further Applications
3. An N40 256K×44 embedded RRAM macro with SL-precharge SA and low-voltage current limiter to improve read and write performance
4. OxRAM for embedded solutions on advanced node: scaling perspectives considering statistical reliability and design constraints
5. Novel Computing Method for Short Programming Time and Low Energy Consumption in HfO2 Based RRAM Arrays
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