Compact In-Situ Sensors for Monitoring Negative-Bias-Temperature-Instability Effect and Oxide Degradation-Reference-Cited by-同舟云学术

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Compact In-Situ Sensors for Monitoring Negative-Bias-Temperature-Instability Effect and Oxide Degradation

Published:2008-02 Issue: Volume: Page:
ISSN:
Container-title:2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers
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Author:

Karl E.,Singh P.,Blaauw D.,Sylvester D.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4497158/4523032/04523231.pdf?arnumber=4523231

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