Fault Detection in Analog/Digtal VLSI Circuits based on Artificial Intelligence
Author:
Affiliation:
1. Minia University,Computers and Systems Engineering Department,Minia,Egypt
2. Effat University,Electrical and Computer Engineering Department,Jeddah,Saudi Arabia
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10462247/10462236/10462277.pdf?arnumber=10462277
Reference29 articles.
1. Fast Auto-Correction algorithm for Digital VLSI Circuits
2. Automated Design Error Debugging of Digital VLSI Circuits;Hussein;Journal of Electronic Testing,2023
3. ABSTRACT APPLICATION OF MACHINE LEARNING IN DIGITAL LOGIC CIRCUIT DESIGN VERIFICATION AND TESTING;Dave,2018
4. Machine Learning and Data Mining Methods in Testing and Diagnostics of Analog and Mixed-Signal Integrated Circuits: Case Study
5. Deep Learning Techniques in Intelligent Fault Diagnosis and Prognosis for Industrial Systems: A Review
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