SOI technology for quantum information processing-Reference-Cited by-同舟云学术

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SOI technology for quantum information processing

Published:2016-12 Issue: Volume: Page:
ISSN:
Container-title:2016 IEEE International Electron Devices Meeting (IEDM)
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Author:

De Franceschi S.,Hutin L.,Maurand R.,Bourdet L.,Bohuslavskyi H.,Corna A.,Kotekar-Patil D.,Barraud S.,Jehl X.,Niquet Y.-M.,Sanquer M.,Vinet M.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7824662/7838021/07838409.pdf?arnumber=7838409

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Multiple-Gate FET Quantum Dot Behavior and a Proximity Charge Sensing Model;IEEE Transactions on Electron Devices;2024-06

2. Quantum-Dot-Based Thermometry Using 12-nm FinFET and Machine Learning Models;IEEE Transactions on Electron Devices;2024-03

3. Electrical manipulation of a single electron spin in CMOS using a micromagnet and spin-valley coupling;npj Quantum Information;2023-10-23

4. TaN thin film study for Superconducting BEOL integration;2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM);2023-05

5. Gate reflectometry in dense quantum dot arrays;New Journal of Physics;2023-03-01

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