Quantum-Dot-Based Thermometry Using 12-nm FinFET and Machine Learning Models
Author:
Affiliation:
1. Department of Electrical Engineering, Indian Institute of Technology Delhi, New Delhi, India
2. GLOBALFOUNDARIES Inc., Malta, NY, USA
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Link
http://xplorestaging.ieee.org/ielx7/16/10457976/10413320.pdf?arnumber=10413320
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Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Developing Process Design Kit (Q-PDK) for Co-Integrated Quantum computers;2024 IEEE Latin American Electron Devices Conference (LAEDC);2024-05-08
2. Performance Analysis and Compact Modeling of 12-nm P-channel Bulk FinFETs at Cryogenic Operating Temperatures for Quantum Computing Applications;2024 IEEE Latin American Electron Devices Conference (LAEDC);2024-05-08
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