25nm 64Gb MLC NAND technology and scaling challenges invited paper-Reference-Cited by-同舟云学术

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25nm 64Gb MLC NAND technology and scaling challenges invited paper

Published:2010-12 Issue: Volume: Page:
ISSN:
Container-title:2010 International Electron Devices Meeting
language:
Short-container-title:

Author:

Prall Kirk,Parat Krishna

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5692854/5703218/05703300.pdf?arnumber=5703300

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. The Fundamentals of NAND Flash Memory: Technology for tomorrow’s fourth industrial revolution;IEEE Solid-State Circuits Magazine;2022

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5. Analysis on applicable error-correcting code strength of storage class memory and NAND flash in hybrid storage;Japanese Journal of Applied Physics;2018-02-14

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