High thermal tolerance of 25-nm c-axis aligned crystalline In-Ga-Zn oxide FET-Reference-Cited by-同舟云学术

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High thermal tolerance of 25-nm c-axis aligned crystalline In-Ga-Zn oxide FET

Published:2018-12 Issue: Volume: Page:
ISSN:
Container-title:2018 IEEE International Electron Devices Meeting (IEDM)
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Author:

Kunitake Hitoshi,Ohshima Kazuaki,Tsuda Kazuki,Matsumoto Noriko,Sawai Hiromi,Yanagisawa Yuichi,Saga Shiori,Arasawa Ryo,Seki Takako,Tokumaru Ryo,Atsumi Tomoaki,Kato Kiyoshi,Yamazaki Shunpei

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8601505/8614478/08614621.pdf?arnumber=8614621

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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