Funder
National Natural Science Foundation of China
Ministry of Education
Inner Mongolia Science Foundation for Distinguished Young Scholars
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software
Cited by
5 articles.
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1. Optimal Test Scenarios based Regression Suite for Functional Verification Closure of Advanced Digital Designs;2024 International Conference on Smart Systems for applications in Electrical Sciences (ICSSES);2024-05-03
2. Optimal Test Sequences for Logic Verification closure in State Dependent RTL Digital designs;2022 13th International Conference on Computing Communication and Networking Technologies (ICCCNT);2022-10-03
3. A Location Analysis for Dynamic Verification;2022 3rd International Conference on Computer Vision, Image and Deep Learning & International Conference on Computer Engineering and Applications (CVIDL & ICCEA);2022-05-20
4. Probabilistic Analysis for Sequential Circuits Verification Using Markov Chains;IEEE Transactions on Circuits and Systems II: Express Briefs;2021-01
5. Temporal Coverage Analysis for Dynamic Verification;IEEE Transactions on Circuits and Systems II: Express Briefs;2018-01