Funder
NSFC Program
National Science and Technology Major Project
MIIT IT Funds (Research and Application of TCN Key Technologies) of China
National Key Technology Research and Development Program
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
7 articles.
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1. Optimal Test Scenarios based Regression Suite for Functional Verification Closure of Advanced Digital Designs;2024 International Conference on Smart Systems for applications in Electrical Sciences (ICSSES);2024-05-03
2. Synthesis-Embedded Verification;2023 8th South-East Europe Design Automation, Computer Engineering, Computer Networks and Social Media Conference (SEEDA-CECNSM);2023-11-10
3. Dynamic Verification Framework of Approximate Computing Circuits using Quality-Aware Coverage-Based Grey-Box Fuzzing;IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences;2023-03-01
4. Optimal Test Sequences for Logic Verification closure in State Dependent RTL Digital designs;2022 13th International Conference on Computing Communication and Networking Technologies (ICCCNT);2022-10-03
5. A Location Analysis for Dynamic Verification;2022 3rd International Conference on Computer Vision, Image and Deep Learning & International Conference on Computer Engineering and Applications (CVIDL & ICCEA);2022-05-20