1. Silent Data Corruption from Timing Marginalities Due to Process Variations;2024 IEEE European Test Symposium (ETS);2024-05-20
2. Scenario-based Test Content Optimization: Scan Test vs. System-Level Test;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
3. Structural Testing: Vmin Silicon Issues and Solutions;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
4. Automotive Semiconductor Test: Challenges and Solutions towards Zero Defect Quality;2023 45th Annual EOS/ESD Symposium (EOS/ESD);2023-10-02
5. Performance Screening Using Functional Path Ring Oscillators;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-06