Scenario-based Test Content Optimization: Scan Test vs. System-Level Test
Author:
Affiliation:
1. University of Stuttgart,Institute of Smart Sensors
2. University of Stuttgart,Institute of Computer Engineering and Computer Architecture
3. Advantest Europe
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10538470/10538498/10538586.pdf?arnumber=10538586
Reference16 articles.
1. Cost effective manufacturing test using mission mode tests
2. Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test
3. System-Level Test: State of the Art and Challenges
4. Applicative System Level Test introduction to Increase Confidence on Screening Quality
5. Functional Test Generation for AI Accelerators using Bayesian Optimization∗
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