Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test-Reference-Cited by-同舟云学术

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Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test

Published:2019-04 Issue: Volume: Page:
ISSN:
Container-title:2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
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Author:

Almeida F.,Bernardi P.,Calabrese D.,Restifo M.,Reorda M. Sonza,Appello D.,Pollaccia G.,Tancorre V.,Ugioli R.,Zoppi G.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8718445/8724630/08724644.pdf?arnumber=8724644

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optimizing System-Level Test Program Generation via Genetic Programming;2024 IEEE European Test Symposium (ETS);2024-05-20

2. Scenario-based Test Content Optimization: Scan Test vs. System-Level Test;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22

3. Automotive Semiconductor Test: Challenges and Solutions towards Zero Defect Quality;2023 45th Annual EOS/ESD Symposium (EOS/ESD);2023-10-02

4. A New High-efficient Burn-in Screening Methodology Applied in Automotive Integrated Circuits Reliability;2023 24th International Conference on Electronic Packaging Technology (ICEPT);2023-08-08

5. Automating Greybox System-Level Test Generation;2023 IEEE European Test Symposium (ETS);2023-05-22

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