On the use of an RTN simulator to explore the quality trade-offs of a novel RTN-based PUF-Reference-Cited by-同舟云学术

On the use of an RTN simulator to explore the quality trade-offs of a novel RTN-based PUF

Published:2022-06-12 Issue: Volume: Page:
ISSN:
Container-title:2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
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Author:

Camacho-Ruiz E.¹,Santana-Andreo A.¹,Castro-Lopez R.¹,Roca E.¹,Fernandez F. V.¹

Affiliation:

1. IMSE-CNM (CSIC/Universidad de Sevilla),Instituto de Microelectrónica de Sevilla

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9816063/9816175/09816287.pdf?arnumber=9816287

Reference17 articles.

1. A novel Physical Unclonable Function using RTN;camacho;Proc of IEEE International Symposium on Circuits and Systems (ISCAS),2022

2. Simulating the impact of random telegraph noise on integrated circuits;saraza-canflanca;Proc International Conference on Synthesis Modeling Analysis and Simulation Methods and Applications to Circuit Design (SMACD),2021

3. A detailed study of the gate/drain voltage dependence of RTN in bulk pMOS transistors

4. Comparison of modeling approaches for transistor degradation: model card adaptations vs subcircuits

5. Statistical Characterization of Time-Dependent Variability Defects Using the Maximum Current Fluctuation

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1. Design considerations for a CMOS 65-nm RTN-based PUF;2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2023-07-03