Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
10 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Peak Detect & Hold circuit to measure and exploit RTN in a 65-nm CMOS PUF;2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2023-07-03
2. Design considerations for a CMOS 65-nm RTN-based PUF;2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2023-07-03
3. Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03
4. Determination of the Time Constant Distribution of a Defect-Centric Time-Dependent Variability Model for Sub-100-nm FETs;IEEE Transactions on Electron Devices;2022-10
5. An Integral Methodology for Predicting Long-Term RTN;IEEE Transactions on Electron Devices;2022-07