Intel 22nm Low-Power FinFET (22FFL) Process Technology for 5G and Beyond

Author:

Lee Hyung-Jin,Callender Steven,Rami Said,Shin Woorim,Yu Qiang,Marulanda Jose Mauricio

Publisher

IEEE

Cited by 18 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. SiGe/Si Superlattice Ferroelectric HfZrO2 ΩFET and CMOS Inverter With SSmin,n = 62.4 mV/dec, ION/IOFF > 1.0 × 107, and Voltage Gain = 111.4 V/V;IEEE Electron Device Letters;2024-02

2. Radio frequency FinFET bulk silicon technology;New Materials and Devices Enabling 5G Applications and Beyond;2024

3. Introduction to 5G applications and beyond;New Materials and Devices Enabling 5G Applications and Beyond;2024

4. Review of the Nanoscale FinFET Device for the Applications in Nano-regime;Current Nanoscience;2023-09

5. Impact of TSV bump and redistribution layer on crosstalk delay and power loss;Memories - Materials, Devices, Circuits and Systems;2023-07

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