Exploration of Various Test Pattern Generators for Power Reduction in LBIST

Author:

Jambagi Savitri Basappa,Yellampalli Siva S.

Publisher

IEEE

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Reduction of Toggling Activity Using Novel LFSR Driven Logic for ULSI Circuits;2023 International Conference on Next Generation Electronics (NEleX);2023-12-14

2. Performance Analysis of a New Low Power BIST Technique in VLSI Circuit by Reducing the Input Vectors;2023 6th International Conference on Electrical Information and Communication Technology (EICT);2023-12-07

3. A Proposal for Low Power Test Pattern Generator;2022 4th International Conference on Smart Systems and Inventive Technology (ICSSIT);2022-01-20

4. Smart Logic Built in Self-Test in SOC;2020 5th IEEE International Conference on Recent Advances and Innovations in Engineering (ICRAIE);2020-12-01

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