Author:
Hakansson P.,Johansson A.,Kamensky I.,Sundqvist B.,Fohlman J.,Peterson P.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
30 articles.
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1. Identification and imaging of modern paints using Secondary Ion Mass Spectrometry with MeV ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-09
2. Time-of-flight MeV-SIMS with beam induced secondary electron trigger;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2016-08
3. MeV-SIMS yield measurements using a Si-PIN diode as a primary ion current counter;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2016-03
4. Time-of-flight mass spectrometry (TOFMS): From niche to mainstream;International Journal of Mass Spectrometry;2015-02
5. Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBS;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2010-06