MeV-SIMS yield measurements using a Si-PIN diode as a primary ion current counter-Reference-Cited by-同舟云学术

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MeV-SIMS yield measurements using a Si-PIN diode as a primary ion current counter

Published:2016-03 Issue: Volume:371 Page:194-198
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Stoytschew Valentin,Bogdanović Radović Iva,Demarche Julien,Jakšić Milko,Matjačić Lidija,Siketić Zdravko,Webb Roger

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference10 articles.

1. Secondary ion emission from bio-molecular thin films under ion bombardment

2. MeV-energy probe SIMS imaging of major components in animal cells etched using large gas cluster ions

3. Depth profiling of fingerprint and ink signals by SIMS and MeV SIMS

4. Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBS

5. Development of mass spectrometry by high energy focused heavy ion beam: MeV SIMS with 8 MeV Cl7+ beam;Jeromel;Nucl. Instr. Meth. B,2014

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Dependence of Megaelectron Volt Time-of-Flight Secondary Ion Mass Spectrometry Secondary Molecular Ion Yield from Phthalocyanine Blue on Primary Ion Stopping Power;Journal of the American Society for Mass Spectrometry;2020-05-26

2. Study of the diacylglycerol composition in the liver and serum of mice with prediabetes and diabetes using MeV TOF-SIMS;Diabetes Research and Clinical Practice;2020-01

3. Secondary Ion Yield and Fragmentation of Biological Molecules by Employing 35Cl Primary Ions within the MeV Energy Domain;Journal of the American Society for Mass Spectrometry;2019-11-20

4. Experimental Setup of the Fast Current Controller for the Buenos Aires Heavy Ion Microbeam;Quantum Beam Science;2019-06-03

5. Influence of experimental parameters on secondary ion yield for MeV-SIMS;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-08

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