Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBS-Reference-Cited by-同舟云学术

Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBS

Published:2010-06 Issue:11-12 Volume:268 Page:1714-1717
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Jones Brian N.,Palitsin Vladimir,Webb Roger

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference17 articles.

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4. E. de Hoffmann, V. Stroobant, Mass Spectrometry: Principles and Applications, third ed., Wiley-Interscience, 2007.

5. Tandem mass spectrometer for secondary ion studies;Benninghoven;Review of Scientific Instruments,1971

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