Asymmetrical characteristics in LDD and minimum-overlap MOSFET's-Reference-Cited by-同舟云学术

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Asymmetrical characteristics in LDD and minimum-overlap MOSFET's

Published:1986-01 Issue:1 Volume:7 Page:16-19
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Chan T.Y.,Wu A.T.,Ko P.K.,Hu C.,Razouk R.R.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/55/31960/01486100.pdf?arnumber=1486100

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