The excess capacitance of a microstrip via in a dielectric substrate

Author:

Wang T.,Mautz J.R.,Harrington R.F.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Circuit model and signal integrity analysis for multilayer printed circuit board interconnection;International Journal of RF and Microwave Computer-Aided Engineering;2013-10-29

2. Novel hybrid analysis method for via structure in microwave multilayer circuits;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2011-03-21

3. RF/microwave modeling and comparison of buried, blind and through-hole vias;Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971);2004

4. Equivalent network synthesis for via holes discontinuities;IEEE Transactions on Advanced Packaging;2002-11

5. Method of lines for the calculation of excess capacitance for a cylindrical via hole in multilayer packaging;IEE Proceedings - Microwaves, Antennas and Propagation;1999

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