Generating At-speed array fail maps with low-speed ATE

Author:

Nelms M.,Gorman K.,Anand D.

Publisher

IEEE

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A 10Gb/s/pin DQS and WCK Built-Out Tester for LPDDR5 DRAM Test;2022 IEEE Asian Solid-State Circuits Conference (A-SSCC);2022-11-06

2. Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip;Journal of Electronic Testing;2011-05-06

3. At-speed Test of High-Speed DUT Using Built-Off Test Interface;2010 19th IEEE Asian Test Symposium;2010-12

4. Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip;2009 14th IEEE European Test Symposium;2009-05

5. Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2008-02

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