Quantitative Theory for Probe-Sample Interaction With Inhomogeneous Perturbation in Near-Field Scanning Microwave Microscopy-Reference-Cited by-同舟云学术

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Quantitative Theory for Probe-Sample Interaction With Inhomogeneous Perturbation in Near-Field Scanning Microwave Microscopy

Published:2016-05 Issue:5 Volume:64 Page:1402-1408
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Wei Zhun,Cui Yong-Tao,Ma Eric Yue,Johnston Scott,Yang Yongliang,Chen Rui,Kelly Michael,Shen Zhi-Xun,Chen Xudong

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx7/22/7467587/07436825.pdf?arnumber=7436825

Cited by 20 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Advanced Microwave Impedance Microscopy for Emerging Materials and Devices;2024 IEEE/MTT-S International Microwave Symposium - IMS 2024;2024-06-16

2. An Efficient Probe Calibration and Compensation Method With ADMM and Regularization Constraint for Near-Field Scanning;IEEE Transactions on Microwave Theory and Techniques;2024

3. Microwave Resonant Spectroscopy of Semiconductors with Micrometer Resolution;Technical Physics;2023-12

4. Multiscaling Differential Contraction Integral Method for Inverse Scattering Problems With Inhomogeneous Media;IEEE Transactions on Microwave Theory and Techniques;2023-09

5. Experiments and Modeling of a Near-Field Millimeter Wave Vector Microscope;2023 Photonics & Electromagnetics Research Symposium (PIERS);2023-07-03

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